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1

[IEEE 12th IEEE European Test Symposium - Freiburg, Germany (2007.05.20-2007.05.24)] 12th IEEE European Test Symposium (ETS'07) - Analyzing Volume Diagnosis Results with Statistical Learning for Yield Improvement

Tang, Huaxing, Manish, Sharma, Rajski, Janusz, Keim, Martin, Benware, Brady

Year:

2007

Language:

english

File:

PDF, 168 KB

english, 2007

2

Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs

Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jędrzej Solecki, Jerzy Tyszer

Journal:

Journal of Electronic Testing

Year:

2011

Language:

english

File:

PDF, 299 KB

english, 2011

3

[IEEE 2014 IEEE 32nd VLSI Test Symposium (VTS) - Napa, CA, USA (2014.04.13-2014.04.17)] 2014 IEEE 32nd VLSI Test Symposium (VTS) - Innovative practices session 2C: Advanced in yield learning

Lin, Yen-Tzu, Benware, Brady, Stine, Brian, Bhavnagarwala, Azeez

Year:

2014

Language:

english

File:

PDF, 100 KB

english, 2014

4

[IEEE 2012 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2012.11.5-2012.11.8)] 2012 IEEE International Test Conference - Improved volume diagnosis throughput using dynamic design partitioning

Fan, Xiaoxin, Tang, Huaxing, Huang, Yu, Cheng, Wu-Tung, Reddy, Sudhakar M., Benware, Brady

Year:

2012

Language:

english

File:

PDF, 527 KB

english, 2012

5

Guest Editors' Introduction: Silicon Debug and Diagnosis

Nicolici, Nicola, Benware, Brady

Journal:

IEEE Design and Test

Year:

2013

Language:

english

File:

PDF, 56 KB

english, 2013

6

SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Soft X-Ray Lasers and Applications III - Generation of a high-average-power and millijoule-level pulses with a tabletop soft x-ray laser

Rocca, Jorge J. G., Benware, Brady R., Macchietto, Christopher D., Shlyaptsev, Vyacheslav N., Rocca, Jorge J. G., Da Silva, Luiz B.

Year:

1999

Language:

english

File:

PDF, 952 KB

english, 1999

7

[IEEE 2008 17th Asian Test Symposium (ATS) - Hokkaido, Japan (2008.11.24-2008.11.27)] 2008 17th Asian Test Symposium - Enhancing Transition Fault Model for Delay Defect Diagnosis

Cheng, Wu-Tung, Benware, Brady, Guo, Ruifeng, Tsai, Kun-Han, Kobayashi, Takeo, Maruo, Kazuyuki, Nakao, Michinobu, Fukui, Yoshiaki, Otake, Hideyuki

Year:

2008

Language:

english

File:

PDF, 345 KB

english, 2008

8

[IEEE 2017 IEEE 26th Asian Test Symposium (ATS) - Taipei City, Taiwan (2017.11.27-2017.11.30)] 2017 IEEE 26th Asian Test Symposium (ATS) - Scan Chain Diagnosis Based on Unsupervised Machine Learning

Huang, Yu, Benware, Brady, Klingenberg, Randy, Tang, Huaxing, Dsouza, Jayant, Cheng, Wu-Tung

Year:

2017

Language:

english

File:

PDF, 431 KB

english, 2017

9

[IEEE 2011 IEEE 20th Asian Test Symposium (ATS) - New Delhi, India (2011.11.20-2011.11.23)] 2011 Asian Test Symposium - On Using Design Partitioning to Reduce Diagnosis Memory Footprint

Fan, Xiaoxin, Tang, Huaxing, Reddy, Sudhakar M., Cheng, Wu-Tung, Benware, Brady

Year:

2011

Language:

english

File:

PDF, 259 KB

english, 2011

10

SPIE Proceedings [SPIE High-Power Laser Ablation - Santa Fe, NM (Sunday 26 April 1998)] High-Power Laser Ablation - Tabletop soft x-ray lasers by fast discharge excitation

Rocca, Jorge J. G., Moreno, Cesar H., Benware, Brady R., Marconi, Mario C., Shlyaptsev, Vyacheslav N., Maccheitto, C., Tomasel, Fernando G., Gonzalez, Juan J., Frati, Maximo, Chilla, Juan L. A., Phipp

Year:

1998

Language:

english

File:

PDF, 6.34 MB

english, 1998

11

[IEEE 25th IEEE VLSI Test Symmposium - Berkeley, CA, USA (2007.05.6-2007.05.10)] 25th IEEE VLSI Test Symmposium (VTS'07) - Silicon Evaluation of Static Alternative Fault Models

Schuermyer, Chris, Pangilinan, Jewel, Jahangiri, Jay, Keim, Martin, Rajski, Janusz, Benware, Brady

Year:

2007

Language:

english

File:

PDF, 394 KB

english, 2007

12

[IEEE 2010 15th IEEE European Test Symposium (ETS) - Praha, Czech Republic (2010.05.24-2010.05.28)] 2010 15th IEEE European Test Symposium - Diagnosis of failing scan cells through orthogonal response compaction

Benware, Brady, Mrugalski, Grzegorz, Pogiel, Artur, Rajski, Janusz, Solecki, Jedrzej, Tyszer, Jerzy

Year:

2010

Language:

english

File:

PDF, 748 KB

english, 2010

13

[IEEE 2011 16th IEEE European Test Symposium (ETS) - Trondheim, Norway (2011.05.23-2011.05.27)] 2011 Sixteenth IEEE European Test Symposium - Diagnosis of Failing Scan Cells through Orthogonal Response Compaction

Benware, Brady, Mrugalski, Grzegorz, Pogiel, Artur, Rajski, Janusz, Solecki, Jedrzej, Tyszer, Jerzy

Year:

2011

Language:

english

File:

PDF, 349 KB

english, 2011

14

SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Soft X-Ray Lasers and Applications III - Applications of high-repetition-rate tabletop soft x-ray laser: laser ablation with a focused beam and reflectometry of materials

Benware, Brady R., Rocca, Jorge J. G., Ozols, A., Macchietto, Christopher D., Chilla, Juan L. A., Artioukov, Igor A., Kasjanov, Yuriy S., Kondratenko, V. V., Vinogradov, Alexander V., Rocca, Jorge J.

Year:

1999

Language:

english

File:

PDF, 2.16 MB

english, 1999

15

[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis

Keim, Martin, Tamarapalli, Nagesh, Tang, Huaxing, Sharma, Manish, Rajski, Janusz, Schuermyer, Chris, Benware, Brady

Year:

2006

Language:

english

File:

PDF, 218 KB

english, 2006

16

[IEEE 2015 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2015.4.27-2015.4.29)] VLSI Design, Automation and Test(VLSI-DAT) - Diagnosing timing related cell internal defects for FinFET technology

Tang, Huaxing, Tai, Ting-Pu, Cheng, Wu-Tung, Benware, Brady, Hapke, Friedrich

Year:

2015

Language:

english

File:

PDF, 545 KB

english, 2015

17

SPIE Proceedings [SPIE Optical Science, Engineering and Instrumentation '97 - San Diego, CA (Sunday 27 July 1997)] Soft X-Ray Lasers and Applications II - Lasing in Ne-like S and other new developments in capillary discharge ultrashort wavelength lasers

Rocca, Jorge J. G., Tomasel, Fernando G., Marconi, Mario C., Chilla, Juan L. A., Moreno, Cesar H., Benware, Brady R., Shlyaptsev, Vyacheslav N., Gonzalez, Juan J., Macchietto, Christopher D., Rocca, J

Year:

1997

Language:

english

File:

PDF, 637 KB

english, 1997

18

[IEEE 2014 IEEE 23rd Asian Test Symposium (ATS) - Hangzhou, China (2014.11.16-2014.11.19)] 2014 IEEE 23rd Asian Test Symposium - Diagnosing Cell Internal Defects Using Analog Simulation-Based Fault Models

Tang, Huaxing, Benware, Brady, Reese, Michael, Caroselli, Joseph, Herrmann, Thomas, Hapke, Friedrich, Tao, Robert, Cheng, Wu-Tung, Sharma, Manish

Year:

2014

Language:

english

File:

PDF, 432 KB

english, 2014

19

[IEEE 2017 IEEE 26th Asian Test Symposium (ATS) - Taipei City, Taiwan (2017.11.27-2017.11.30)] 2017 IEEE 26th Asian Test Symposium (ATS) - Automatic Identification of Yield Limiting Layout Patterns Using Root Cause Deconvolution on Volume Scan Diagnosis Data

Cheng, Wu-Tung, Klingenberg, Randy, Benware, Brady, Yang, Wu, Sharma, Manish, Eide, Geir, Tian, Yue, Reddy, Sudhakar M., Pan, Yan, Fernandes, Sherwin, Chittora, Atul

Year:

2017

Language:

english

File:

PDF, 968 KB

english, 2017

20

[IEEE 2009 27th IEEE VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2009.05.3-2009.05.7)] 2009 27th IEEE VLSI Test Symposium - Bridging DFM Analysis and Volume Diagnostics for Yield Learning - A Case Study

Turakhia, Ritesh, Ward, Mark, Goel, Sandeep Kuma, Benware, Brady

Year:

2009

Language:

english

File:

PDF, 900 KB

english, 2009

21

[IEEE 2011 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2011.09.20-2011.09.22)] 2011 IEEE International Test Conference - A novel Test Access Mechanism for failure diagnosis of multiple isolated identical cores

Sharma, Manish, Dutta, Avijit, Cheng, Wu-Tung, Benware, Brady, Kassab, Mark

Year:

2011

Language:

english

File:

PDF, 840 KB

english, 2011

22

[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - Case study of scan chain diagnosis and PFA on a low yield wafer

Huang, Yu, Benware, Brady, Cheng, Wu-Tung, Tai, Ting-Pu, Kuo, Feng-Ming, Chen, Yuan-Shih

Year:

2010

Language:

english

File:

PDF, 209 KB

english, 2010

23

SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Soft X-Ray Lasers and Applications III - XUV laser reflectometry for optical constant determination

Artioukov, Igor A., Benware, Brady R., Rocca, Jorge J. G., Forsythe, Matt, Uspenskii, Yurii A., Vinogradov, Alexander V., Rocca, Jorge J. G., Da Silva, Luiz B.

Year:

1999

Language:

english

File:

PDF, 367 KB

english, 1999

24

SPIE Proceedings [SPIE Optical Science, Engineering and Instrumentation '97 - San Diego, CA (Sunday 27 July 1997)] Soft X-Ray Lasers and Applications II - Spatial coherence of a capillary discharge soft x-ray amplifier

Chilla, Juan L. A., Marconi, Mario C., Rocca, Jorge J. G., Moreno, Cesar H., Benware, Brady R., Rocca, Jorge J. G., Da Silva, Luiz B.

Year:

1997

Language:

english

File:

PDF, 299 KB

english, 1997

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